International Workshop on Transmission Electron Microscopy
One-Day International Workshop on Transmission Electron Microscopy Organised at SAIF/CIL, Panjab University, Chandigarh.
City Air News
Jan 28, 2026 09:22
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Chandigarh, January 28, 2026: The Department of SAIF/CIL, Panjab University, Chandigarh, in association with JEOL India Pvt. Ltd., organised a one-day International Workshop on “Transmission Electron Microscopy – Operation, Imaging and Applications”. The workshop was conducted in hybrid mode, witnessing enthusiastic participation from researchers, academicians, and students across the country.
The technical sessions featured expert lectures by Dr. Tetsuo Oikawa, JEOL Japan, and Dr.Anindya Datta, Director, Institute of Nano Science and Technology (INST), Mohali. The speakers shared valuable insights into the principles, advanced imaging techniques, and diverse applications of Transmission Electron Microscopy (TEM), highlighting recent developments in the field.
A total of 115 participants attended the workshop, with 70 participant’s present offline 45 participants joining online, reflecting the wide reach and relevance of the event. The workshop provided an excellent platform for knowledge exchange and interaction between industry experts and the academic community.
Offline participants were also given hands-on exposure on the High Resolution –Transmission Electron Microscope available in the Department.
The organisers expressed gratitude to JEOL India Pvt. Ltd. for their collaboration and support, as well as to the speakers for their insightful contributions.
